TENDER NO: NIQ/PD/APD/2010
Global Tender Document For Purchase of Scientific Equipments in JMI
Dated : 08.10.2010
JAMIA MILLIA ISLAMIA JAMIA NAGAR
New Delhi –110025.
Jamia Millia Islamia(JMI)
Jamia Nagar, New Delhi-110025, INDIA
NIQ Ref.: JMI/PD/APD/2010
GLOBAL TENDER NOTICE
Separate Sealed Global Tenders are invited from leading overseas manufacturers AND/OR their accredited INDIAN ASSOCIATES for supply, installation and commissioning of the " Scientific Equipments' in the following Department(s) in two bid systems so as to reach the Asstt. Registrar (PICO) on or before November, 12, 2010 upto 1600 hrs. The Tender Documents can be downloaded from Jamia’s website http://www.jmi.ac.in.
Deptt. of Applied Science: High Resolution Scanning Electron Microscope, Sensor Probe Station (I-V Set up), Atomic Force Microscope, and FTIR Spectrometer.
Deptt. of Physics : Microwave Plasma Enhanced Chemical Vapor Deposition (MPECVD)/PECVD System, Scanning Probe Microscope, and Gold Coating Unit for SEM.
Dated: 08.10.2010 Sd/-
Registrar
Jamia Millia Islamia
Jamia Nagar, New Delhi -110025.
Global Tender Document
Cash Receipt/Bank Draft No
Dated:…………..
1. Name of the Firm : ………
2. Address with telephone No. : …...
3. Earnest Money a) Bank draft/Pay Order No………
(to be deposited along with b) Date ………..
Tender document c) for Rs………
d) Drawn on……….
4. E-Mail Address ………..
Scope of Work
The work to be rendered by the supplier under this tender/agreement is supply, delivery and commissioning of the equipment and training at the users’ p remises. The tender should include the installation material wherever required.
(Signature of Tenderer with Seal)
Non transferable tender documents (in two bids systems) in sealed envelopes are invited. The detailed specifications and other terms and conditions can be had by the bidders directly by down loading from the Institute's website www.jmi.ac.in which will be made available till last date of submission of tender. No separate tender documents will be issued from our office. All errata, addendum, extension etc if any shall be published in the above website only. The following must be clearly super-scribed on the sealed envelope.
Bids for supply of ………..(item name) for the department of ………
…………(name of Department….., JMI, New Delhi. (NIQ REF. NO.) dated………
A)
Department of Applied Sciences & Humn., F/O Engineering & Technology
SL.
No. Tender Notice NO Description of the Items
Non - Refundable Tender Fees
Earnest Money Deposit (Refundable to
unsuccessful bidders without
any interest)
Validity of Offer from the date of opening
of the tender
Date &
Time for submission
of Tender
Date &
time of Opening of
Tender (Technical
Bid)
1 NSRL/MIT-2/01/2010 High Resolution Scanning Electron Microscope (HRSEM)
Rs.1000/ OR
US$ 20 Rs.3,50,000/- OR
US.$.8000 120
days
12/11/2010
16.00 hrs 18/11/2010 15.00 hrs
2 NSRL/MIT-2/02/2010 Sensor Probe station(I- V set up)
Rs.1000/ OR US$ 20
Rs.1,00,000/- OR
US.$.2200 120
days
12/11/2010
16.00 hrs 18/11/2010 15.00 hrs
3 NSRL/MIT-2/03/2010 Atomic force
Microscope(AFM) Rs.500/ OR
US$ 20 Rs.1,50,000/- OR
US.$.3500 120
days
12/11/2010
16.00 hrs 18/11/2010 15.00 hrs
4. NSRL/MIT-2/04/2010 FTIR Spectrometer Rs.500/ OR US$ 15
Rs.2,00,000/- OR
US.$.5000 180
Days
12/11/2010
16.00 hrs 18/11/2010 15.00 hrs
B) Department of Physics, F/O Natural Sciences
SL.
No.
Tender Notice NO Description of the Items
Non - Refundable Tender Fees
Earnest Money Deposit (Refundable to
unsuccessful bidders without
any interest)
Validity of Offer from the date of opening
of the tender
Date &
Time for submission
of Tender
Date &
time of Opening of
Tender (Technical
Bid)
1 PD/MCIT-01/2010 Microwave Plasma Enhanced Chemical Vapor Deposition.
(MPECVD)/PECVD
Rs.1000/- Or equivalent
Rs.3,00,000/-
Or equivalent 120 days
12/11/2010
16.00 hrs 15.00 hrs 18/11/2010
2 PD/MCIT-02/2010 Scanning Probe
Microscope Rs.1000/-
Or equivalent Rs.1,50,000/- Or equivalent
120 days
12/11/2010
16.00 hrs 18/11/2010 15.00 hrs
3 PD/MCIT-03/2010 Gold Coating Unit For SEM
Rs.500/ - Or equivalent
Rs.10,000/-
Or equivalent 120 days
12/11/2010
16.00 hrs 18/11/2010 15.00 hrs
The Institute reserves the right to accept / reject any offer in full / part without assigning any reason whatsoever and the decision of the Institute shall be final and binding and the aforesaid global tender is being issued with no financial commitment. No correspondence or representation on the subject will be entertained.
Prof. S.M. Sajid
Registrar
Jamia Millia Islamia (A central University
INSTRUCTION TO BIDDERS:
Two Bids:
01. Quotations will have to be submitted in TWO PARTS i.e. (a) Technical Bid and (b) Price Bid, in two separate properly sealed covers indicating the type of Bid; and both these covers will have to be again put in to a single sealed cover (For type of bid please see the Check List).
02. In the part relating to Technical Bid, the vendor must provide the followings:
(a) Details of the technical features of the offered equipment vis-à-vis NIQ specification;
(b) Standard Technical literature on each of the items offered;
(c) Dealership certificate on the offered products in case of dealer/s;
(d) List of reputed organizations/Institutions, where similar orders have been executed (copies of the purchase/work orders will have to be enclosed);
(e) Up-to-date Sales Tax clearance certificate (for vendors outside the State of Delhi)/VAT Registration Certificate indicating also the TIN number (for vendors from within the State of Delhi) of the firm will have to accompany the quotation to be submitted;
(f) Details of nature and maximum period of warranty offered by the vendor.
g) After Sales Service: The name & address of the nearest available authorized service centre to JMI, should be stated in the quotation.
(h) Amount of Earnest Money Deposit (EMD), in the form of Demand Draft only, will have to be clearly stated and the same will have to be enclosed with Technical bid only.
03. In the part relating to Price Bid, the vendor must provide the followings:
(a) Quantity, basic price (against item-wise details of specifications of each of the offered items);
(b) Prices of each of the optional accessories, as required by NIQ specifications and also may be relevant for an offered equipment, will have to be specifically stated in the quotation:
(c) Packing & Forwarding Charge, if any (as percentage of basic price or as lump sum)
(d) Central/State Sales Tax/VAT (as percentage of basic price + Packing & Forwarding Charge, if any)
(e) Freight & insurance charge, if any [as percentage of (a) + (b) + (c) or as lump sum]
(f) Annual Maintenance Contract (AMC) rate (after expiry of warranty period) is to be clearly indicated – preferably in both comprehensive and non-comprehensive terms, failure to which the offer may not be considered even if it turns out to be at the lowest price.
(g) Installation & commissioning charge (including Service Tax), to be shown item-wise extra, if any.
NOTE: The bid documents are not transferable and the firm’s seal and signature of the authorized official must appear on all papers and envelopes submitted
D) Date and Times:
(i) Last date & time for receipt of tender: 12/11/2010, 16.00Hrs.
(ii) Due date & Time of opening tender: 18/11/2010, 15.00Hrs.
TERMS & CONDITIONS:
(Please note the term ‘both foreign & indigenous’ wherever mentioned, means the term is applicable to Both foreign & indigenous purchase)
01. Rates: Rates quoted for indigenous items must be on FOR JMI, New Delhi, on DOOR DELIVERY Basis, with break-ups as per details below (For import items please refer ‘Additional Terms for imported goods’ at clause No. 25 below).
Break-ups of cost:
(a) Basic Price
(b) (+) Central Excise Duty, if any
(c) (+) VAT/ Central Sales Tax (On Sub-Total Price, including Excise Duty, if any) (d) (+) Freight & Insurance Charge, if any
(e) (+) Installation & Commissioning Charge, if any (f) Grand Total F.O.R. JMI, New Delhi, Price
Note: Vague terms like “packing, forwarding, transportation etc. extra” without mentioning the specific amount will not be accepted. Such offers shall be treated as incomplete and rejected.
Bidders shall indicate their rates in clear/visible figures as well as in words and shall not alter/
overwrite/make cutting in the quotation. In case of a mismatch, the rates written in words will prevail.
02. Validity (Both foreign & indigenous): Quoted rates must be valid for 120 days.
03. Earnest Money (Both foreign & indigenous):
All firms are required to submit Earnest Money along with the Technical Bid as per EMD deposit options provided below. The EMD of unsuccessful bidders shall be returned after award of contract.
All tenders received without EMD shall be summarily rejected. EMD of the successful bidder will be released on submission of the PBG.
04. PERFORMANCE BANK GUARANTEE (PBG) (Both foreign & indigenous):
Performance Bank Guarantee: The successful bidder shall furnish an unconditional Performance Bank Guarantee valid till the standard warranty period from a scheduled Bank for 10% of the Purchase Order value and should be submitted during the time of installation of the system.
(APPLICABLE ONLY TO ORDERS COSTING MORE THAN INR Rs. 5,00,000.00). That (a) The Vendor shall provide a Certificate of Guarantee guaranteeing XXX (Name of equipment) of the satisfactory operation of the components and against poor workmanship, bad quality of materials used, faulty designs and performance figures given by the Vendor.
(b) This guarantee shall be operative for the entire warranty period. The performance guarantee would be to the extent of 10% of the order value.
(c) The Vendor shall at his own cost rectify the defects/replace the items supplied, for defects identified during the period of guarantee.
(d) While clauses 4(a), 4(b) and 4(c) are applicable to all orders worth INR Rs. 5,00,000.00 or more, competent authority may take appropriate decisions on exceptional cases.
05. PENALTY FOR DELAYED DELIVERY (for both foreign & indigenous):
In case of supply order for the SCIENTIFIC EQUIPMENTS/ APPARATUS, the date of delivery should be strictly adhered to. In the event of delayed delivery, installation & commissioning i.e.
after the expiry of the period as agreed by both the parties, the vendor shall be liable for a penalty deduction at a percentage of the value of the undelivered equipment subject to a maximum of 10%
(ten percent) as detailed below:
@1% up to one week;
@2.5% up to two weeks;
@5% up to three weeks;
@10% for four weeks and above
For the purpose of this clause, part of the week is considered as a full week. In case of delayed delivery, the Registrar, JMI reserves the right not to accept the subject consignment.
06. IN CASE OF INDIGENOUS SUPPLIES, the goods should be insured against theft, loss or breakage during transit and insurance charges should not exceed 1% of the cost of material supplied, the rates of Sales Tax, Excise Duty etc. (as applicable) should be clearly indicated. Form C & D is not applicable to us.
07. Pre-installation requisites (Both foreign & indigenous):
Pre-installation requisites (electrical/floor/space/air-conditioning etc.), if any should invariably be mentioned clearly. Installation/ Training will be the full responsibility of the supplier/ Indian Agent.
08. Genuine Pricing (Both foreign & indigenous):
Vendor is to ensure that quoted price is not more than the price offered to any other customer in India to whom this particular item has been sold, particularly to IIT/Universities and other Government Organizations. Copy of the latest price list for the quoted item, applicable in India, must be enclosed with your offer.
09. Excise Duty: The Institute is exempted from payment of Central Excise Duty vide GOI Notification No. 10/97-Central Excise, dated 01.03.97 with Regn.No. TU/V/RG-CDE (351)/2006, dated 14.09.2006.
10. VAT: For a vendor within the State of Delhi, appropriate VAT (to be deducted at source) will be applicable. For exemption from Octroi, wherever required, the Institute will issue necessary certificates.
11. Entry Tax: Delhi Govt. Entry Tax – usually @4% [to be paid by JMI, not by the vendor], wherever applicable, will be added while evaluating cost status of the concerned equipment to be supplied by vendors from outside the State of Delhi.
12. Delivery: (a) Delivery of goods at JMI, New Delhi, will have to be maximum within 120(hundred twenty) days from the date of issue of the Purchase Order.
(b) Safe delivery of goods: All aspects of safe delivery shall be the exclusive
responsibility of the vendor. At the destination site, the cartons will be opened only in the presence of JMI user/representative and vendor's representative and the intact position of the seal for not being tempered with, shall form the basis for certifying the receipt in good condition.
(c) No Part Delivery: Part shipment will not be allowed.
13. Mode of Payment for Indigenous Purchase (For import items please refer ‘Additional Terms for imported goods’ clause No.25 below):
Payment for Indigenous Purchases will be within 45 days from the date of successful delivery and installation of goods at JMI , generally through A/c payee cheque. In case payment is to be made by DD, the Draft commission will be deducted from the bill amount.
Note: Please note as per Institute’s norm advance payment is not allowed for indigenous purchase.
14. Quotation by Fax/Mail not Acceptable (Both foreign & indigenous):
The offers submitted by telex/ telegram/ fax/ E-mail etc. shall not be considered. No correspondence will be entertained on this matter.
15. Late and delayed tender (Both foreign & indigenous):
Late and delayed tender will not be considered. In case any unscheduled holiday occurs on prescribed closing/opening date the next working day shall be the prescribed date of closing/opening.
16. Conditional tenders not acceptable (Both foreign & indigenous): Conditional tenders shall not be accepted on any ground and shall be rejected straightway. In other words, printed conditions mentioned in the tender bids submitted by vendors will not be binding on JMI. All the terms and conditions for the supply, payment terms, penalty etc. will be as those mentioned herein and no change in the terms and conditions by the vendors will be acceptable.
17. Specifications are basic essence of the product (Both foreign & indigenous): It must be ensured that the offers are strictly as per our specifications. At the same time it must also be kept in mind that merely copying our specifications in their quotation shall not make firms eligible for consideration. A quotation has to be supported with the printed technical leaflet/literature (wherever applicable) and the specifications mentioned in the quotation must be reflected/ supported by such printed technical leaflet/literature model quoted/tendered specifications should invariably be highlighted in the leaflet/literature for easy reference.
18. Enquiry during the course of evaluation not allowed (Both foreign & indigenous): No enquiry shall be made by the bidder(s) during the course of evaluation of the tender till final decision is conveyed to the successful bidder(s). However, the Committee/its authorized representative and office of Registrar, JMI can make any enquiry/seek clarification from the bidders. In such a situation, the agency shall extend full co-operation. The bidders can also be asked to arrange demo of the offered items, in a short period notice, as such the bidders have to be ready for the same.
19. The acceptance of the quotation (Both foreign & indigenous) will rest solely with the Registrar, JMI who in the interest of the Institute is not bound to accept the lowest quotation and reserves the right to himself to reject or partially accept any or all the quotations received without assigning any reasons.
20. In case, the no. of bidders for any item is less than three and more than one, the Register, JMI who in the interest of the Institute has the right to go ahead with the purchase procedure.
21. In case, the no. of bidders for any item is only one and the proprietary certificate is enclosed for that specific item then the Register, JMI who in the interest of the Institute has the right to accept the single quotation and go ahead for price negotiation.
22. Force Majeure (Both foreign & indigenous): If the performance of the obligation of either party is rendered commercially impossible by any of the events hereafter mentioned that party shall be under no obligation to perform the agreement under order after giving notice of 15 days from the date of such an event in writing to the other party, and the events referred to are as follows: (I) any law, statute or ordinance, order action or regulations of the Government of India. (II) Any kind of
natural disaster and (III) Strikes acts of the Public enemy, war, insurrections, riots, lockouts, sabotage.
23. Termination for default (Both foreign & indigenous): Default is said to have occurred. If the supplier fails to deliver any or all of the services within the time period(s) specified in the purchase order or any extension thereof granted by JMI.
· If the supplier fails to perform any other obligation(s) under the contract.
. If the vendor, in either of the above circumstances, does not take remedial steps within a period of 30 days after receipt of the default notice from JMI (or takes longer period in-spite of what JMI may authorize in writing), JMI may terminate the contract/ purchase order in whole or in part and forfeit the EMD/PBG as applicable. In addition to above, JMI may at its discretion also take the following actions:
JMI may procure, upon such terms and in such manner, as it deems appropriate, goods similar to the undelivered items/products and the defaulting supplier shall be liable to compensate JMI for any extra expenditure involved towards goods and services obtained.
24. Applicable Law (Both foreign & indigenous):
(a) The contract shall be governed by the laws and procedures established by Govt. of India and subject to exclusive jurisdiction of Competent Court and Forum in Delhi, India only.
(b) Any dispute arising out of this purchase shall be referred to the Registrar, JMI, and if either of the parties hereto is dissatisfied with the decision, the dispute shall be referred to the decision of an Arbitrator, who should be acceptable to both the parties, to be appointed by the Registrar, JMI. The decision of such Arbitrator shall be final and binding on both the parties.
ADDITIONAL TERMS FOR IMPORTED GOODS
Following terms besides the fore mentioned terms will be applicable in case of foreign purchases:
25. Rates: Quoted rates should be in CIF/CIP Delhi terms and charges to be stated in the following break-ups:
(a) Ex-works value
(b) + Documentation & Handling Charge, if any
(c) + Estimated Overseas Freight to be paid at actual against authentic documents and monetary receipt
(d) + Estimated Overseas Insurance Charge to be paid at actual against authentic documents and monetary receipt (In case the firm holds open insurance policy, the Insurance Certificate relating to the consignment will have to be provided).
(e) Total CIP/CIF Delhi value
26. After Sales Service: In case of imported items, foreign manufacturing firms should indicate facilities available for after sales service, detail address and contact number of their local representative in India without which their offers are liable to be ignored.
27. Delivery:
(a)Delivery of goods at JMI, New Delhi will have to be maximum within 120(hundred twenty) days from the date of issue of the Purchase Order.
(b)Delivery at IGI Delhi Airport only.
(c)While transshipment will be allowed, part shipment will not be allowed.
28. Payment:
(a).Above $10,000.00 or equivalent : By an irrevocable letter of Credit at CIF/CIP Delhi value negotiable through any overseas branch approved by the university’s Banker, Indian Bank.
(b)Below $10,000.00 by FDD/Wire Transfer.
29. Customs Duty: The Institute is generally exempted from payment of Customs Duty vide GOI Notification No.51/96-Customs, dated 23.07.96, with Regn. No. TU/V/RG-CDE (351)/2006, dated 14.09.2006. [CUSTOMS DUTY EXEMPTION CERTIFICATE WILL BE MADE AVAILABLE BY THE INSTITUTE IN REGARD TO QUOTES IN FOREIGN CURRENCY ONLY [ NOT AGAINST QUOTES MADE BY A FIRM IN INDIAN CURRENCY, UNLESS THE CONCERNED FIRM IS A FOREIGN HOLDING COMPANY WITH `FDI’ CERTIFICATE ISSUED BY THE MINISTRY OF FINANCE, GOVT. OF INDIA ].
30. Agency Commission: The percentage of ex-works value to be paid to Indian agent in equivalent Indian currency as agency commission as applicable will have to be clearly stated in the
quotation wherever applicable.
31. Country of Origin: While Country of Origin Certificate will not be insisted, the same however will have to be stated in the Original Invoice for payment through LoC.
32. LoC Amendment: LoC/FDD amendment charges due to mistake on the part of the supplier, if any, will have to be borne by the supplier.
(Prof. S.M. sajid) Registrar, JMI.
Encl.: ANNEXURES AS INDICATED IN THE CHECK LIST
ANNEXURE-I
Technical Specifications
High Resolution Scanning Electron Microscope (HRSEM) (with EDS and STEM attachment)
The proposed HRSEM (High Resolution Scanning Electron Microscope) is a high resolution scanning microscope, which is intended primarily for use to investigate the microstructure and perform chemical analysis using Energy Dispersive X-ray Spectroscopy (EDS) and STEM imaging.
Detailed specifications are as follows:
(These are minimum specifications for a guideline. Any variations must be highlighted)
S.No. Item Requirement
1. Accelerating Voltage 500 V to 30 kV or better in the minimum range.
The system should be equipped with beam deceleration mode hardware and software.
2. Gun Type FEG (Schottky type)
3. Resolution (SE) 1. 1.0 nm at 15 kV or better
2. 2.0 nm at 1 kV (normal mode) or better
3. 1.6 nm or better at 1 kV, with ultra low landing voltage option (i.e. Gentle beam or beam Deceleration or equivalent)
4. Magnification x 800,000 or better (continuously variable) 5. Probe current 100 nA or higher
6. Detectors, Apertures &
Filters
1. High Efficiency Standard In-lens SE Detector , 2. In-lense BSE Detector,
3. Everhardt Thornley SE detector or any alternative, 4. IR-CCD, if any
5. Energy Dispersive X Ray detector (specifications given In cl.12)
6. STEM imaging detector (specification given in cl.13) Note: In case, the system is fitted with some special features, like special detectors, filters, or, additional hardwares, or patented technology for better imaging or signal collections it should be mentioned clearly.
The list of detectors should be quoted as per standard in-built detectors given in the technical specifications mentioned in the literature. False claim of any detector or hardware will result in the rejection of the Bid without giving any reason.
7. Stage 5-axis motorized specimen Stage with X/Y/Z/T/R movements as X = 100 mm or more, Y = 100 mm or more,
Z = 25mm or more
T = (-5) to +60 Degrees or better, R = 360 Degrees
8. Specimen Size & specimen holders
Sample size should be 100 mm diameter or more
Clearly indicate the step size, reproducibility and accuracy of movement of the stage with respect to the different axes.
- Stage movement through mouse/joystick
- Multiple specimen holder for SEM studies - Holder for STEM studies
Quote separately for any other optional specimen holders that may be available.
9. Evacuation system: Fully automatic evacuation system with appropriate pressure gauges. Appropriate safety interlocks should be provided.
10. Safety devices : Safety devices against power/vacuum failures . Suitable Online UPS (10KVA) System with required capacity & back- up time ( one and half hour) for the ion-pump.
11. Vacuum System 1. Fully automatic PC controlled vacuum System 2. Status display on computer monitor
3. IP/TMP backed by rotary or diaphragm pump(s) with anti- contamination trap and protection against power, water and Vacuum failures.
4. Cooling water circulator system.
5. sample/ chamber cleaning arrangement, if any
12. EDS - Capability to detect elements with atomic number > 5 Liquid Nitrogen free Silicon Drift Detector (SDD) with 30mm2 size or better
-Resolution at Mn-Kα should be equal to 129eV or better (lower in magnitude)
- connector for EDS interface
-Data analysis software with the following features:
Quantitative and qualitative analysis, Dot mapping, Automatic spectrum acquisition at multiple pre-defined locations, Capability to do elemental mapping and save mapped images in colour, Capability to add, subtract and otherwise manipulate elemental images.
Please quote separately for ‘standards’ sample for quantitative analysis.
- For Data acquisition, The support computer with latest Pentium based PC with the following configurations or better:
speed -3 GHz or Intel Pentium dual processor, 4 GB RAM or higher, 300 GB HD or higher, Original Intel motherboard, DVD/RW ROM drive, 2USB port front side, 2 USB port backside, 10/100/1000 gigabit NIC, additional bays to increase HDD capacity, MS window XP (or latest available) operating system and MS office, and 19’’ LCD monitor, & photo-quality color Deskjet printer.
The purpose of the support computer is to store information like micrographs, analytical results and enable acquisition of the information even when SEM is not operating. The computer would have to be interfaced with the SEM computer to enable data/information transfer and storage.
13. STEM Imaging Detector Required for both dark- and bright field imaging high resistive semiconductors, powders and nanotubes, ceramics and
magnetic materials with good contrast and clarity. The imaging should provide high contrast for the said materials at low voltage (<20 KV).
14. System Control -Workstation/ computer for microscope: A 32-bit graphical user interface with Window XP (or latest available), microscope control software, storage of images on floppy disk, DVD or hard disk in various formats (TIFF, JPG, BMP,etc.). The microscope hould be controlled from windows graphical user interface running at a 1280X1024 or better screen resolution. The SEM workstation/ computer system should be fully compatible with and be able to (seamlessly) talk to the EDS system so that machine parameters are automatically updated during analysis.
For Data acquisition, Latest Pentium based PC with the
following configurations or better: speed -3 GHz Intel Pentium dual processor, 4 GB RAM, 300 GB HD, Original Intel
motherboard, DVD/RW ROM drive, 2USB port front side, 2 USB port backside, 10/100/1000 gigabit NIC, additional bays to increase HDD capacity, MS window XP (or latest available) operating system and MS office, and 19’’ LCD monitor, &
heavy duty laserjet printer.
- Appropriate microscope control software for alignment, image capture and archival etc.
- Should offer both automatic and manual control of features like dynamic focus, topographical contrast, compositional
contrast, astigmatism correction.
15. Image processor Maximum resolution 3072X2034 pixels or better. Continuous averaging for upto 256 frames, line averaging upto 256 lines.
16. Image/Data display 19’’ or bigger flat panel LCD monitor for image display at 1024X884 pixels or better, configurable for single frame display or 4-quadrant display. Data-accelerating voltage, magnification, micron marker with value, file no., WD, date/time detector, and user comments etc. Latest MS window based system (graphical user interface, keyboard, optical mouse). Line profile display.
Comprehensive image annotation facilities with desirable fonts and colors.
17. Image Analysis and Data base software
Should provide at least the following basic features:
Point, linear and area measurement Line profile
Annotation
Database (with image archival, retrieval and search functionalities)
18. Power supply and Uninterrupted Power System (UPS)
The system and its accessories should be capable of operating at 220V, 50Hz power supply through on line UPS (3 phase input &
single phase output) for one and half hour back up with dry fit batteries and plug-in connections and dialogue mode.
19. Pre-Installation Requirements
Pre-installation requirements such as room size, required power rating, utility requirements – CC chiller, gases (argon, N2) etc.
are to be clearly mentioned.
The complete system, including computers and accessories, must be properly shielded from EMI interference.
Site inspection and qualification must be performed by vendor’s authorized representative, well in advance of system delivery.
Please specify if any specialized equipment (such as cranes) is required for the installation.
20. Manuals and circuit diagrams
Complete set of manuals (hard copy) for the operation and the servicing of the complete equipment. All circuit diagrams, block diagrams, and other electrical and mechanical schematics must be provided for main unit, subsystems and accessories (including bought-out items).
21. Spare Parts Recommended set of spares and consumables for three years trouble free operation from the date of installation (Please provide a complete list of spares with item-wise price).
The system should be provided with three spare FE tips without any additional cost and the vendors should ensure that these tips may be provided whenever they are asked for to supply.
22 Sample Preparation Kit For SEM & STEM imaging- Sputter coater with carbon/gold coating unit, ion milling, electropolishing, ultrasonic disk cutter units.
23. Calibration standards Standard samples to check system calibration and other parameters should be supplied.
24. Installation and commissioning
The manufacturer should undertake to install and commission the equipment and all accessories and also demonstrate the performance at site. This demonstration shall include:
- the resolution of the FESEM at low and high kV as mentioned in sl no. 3or as quoted by the vendor(s).
- the resolution of the EDS , and the STEM detector as prescribed in sl.no.12 and 13 respectively.
If the vendor fails to prove the above tests, the installation report will not be signed.
25. On-site & Factory site Training
After installation and commissioning, the manufacturers must train, at JMI, at least four scientists in the operation and routine maintenance of the equipment and all accessories.
Two scientists will be provided one week Application Training at factory site of the country of origin. The cost of all
expenditures (including transport cost, stay, food, and some addl.
Money to support his stay) will be borne by the vendor.
26. Guarantee/warranty/
Assurance
The complete supply must be guaranteed for free repairs/
replacements for thirty six months from the date of installation, commissioning and acceptance by JMI. During the warranty period, all software updates must be provided free of cost. If any items are excluded from warranty, they must be explicitly mentioned, along with their replacement cost.
27. Extended warranty / Maintenance contract
Also quote separately for an extended warranty for a period of three years, to commence at the end of the basic warranty (see 28 above). Alternatively, cost and associated terms & conditions (including the number of preventive /break-down visits offered
annually) for annual maintenance contracts for a two-year period may also be indicated.
28. After-sales service and support
Please provide a list of the following:
(a) List of installations
(b) List of service centers (please indicate the one that will support JMI)
(c) Number of company trained engineers at each service center (d) An undertaking that the principals will supply all required spares and service the equipment for twelve years from date of commissioning.
(e) Free of cost software upgradation will be done time to time whenever it is required
(f) The vendor may be asked to provide a trained and
experienced operator for running the machines initially for one year and it may be renewed every year if necessary. In such case, the vendor must quote the monthly remuneration for the operator as optional. Final negotiation may be done after the opening of the commercial Bid.
Note: 1.While quoting a particular model for this bid the vendor has to stick strictly to the standard specifications of that particular model as given in the product literature. The Tender specifications are not in detail and if any item(s) is omitted in the Tender specifications then that can not be an excuse on the part of the vendor (s) to delete that particular item(s) in the technical as well as commercial bids just to bring down the net price of the total system. In such cases, the commercial bid will liable to be rejected without giving any reason.
2. If filament exchange (in case of first FE-Tip replacement work) needs FE-Gun replacement then it should be clearly mentioned and the vendor has to bear the cost of gun replacement without charging any extra on the buyer.
3. If FEG source goes wrong during the warranty period it is to be replaced by the vendor free of cost within 20 days, failing which the EMD amount will be forfeited.
4. The firm will supply upgraded software for FESEM operation for a period of 10 years.
5. Any manipulation/ fraudulent activity, if any, is found at a later stage the PBF and the unpaid balance amount including EMD will be forfeited without giving any explanation.
6. If the vendor fails to prove particularly the resolution factor of the system as quoted in Sl.no.3, 12 and 13 during installation the payment of remaining balance plus the EMD amount will not be made till the installation is done as per commitment.
Terms and Conditions
The system must be complete in all respects. Any other items required for specific function must be quoted and supplied. Manufacturer or representative must ensure complete integration of all sub- systems with cables, connectors as required.
In addition, the vendor must guarantee availability of service and supply of spare parts at least for a period of 12 years. The suppliers should clearly bring out in their offer as to which module can be serviced at component level. If component level servicing is not recommended for any card/module, then the same should be included in the list of recommended spares unless the supplier’s representative in India stocks it. It will be the manufacturer’s responsibility to obtain permission from their Government for the export of the items/accessories including spares to India.
ANNEXURE-II
SPECIFICATIONS FOR SENSOR PROBE STATION (I-V Set up) General description
A Semiconductor Characterization System to perform device characterization, real-time plotting, and analysis with high precision and resolution, while remaining a highly integrated, flexible, upgradable and user-friendly package.
Features and functionality
The System must be integrated in that (a) it must include the specified functionality within the same physical mainframe, and (b) all hardware modules must be controlled from within the same overall software application / test executive. The System must include: two (2) DC source-measure
channels (SMU) and one (1) multi-frequency CV meter as detailed below.
1. Each DC channel SMU must be capable of sourcing and measuring in the following range:
Voltage
- Voltage Source: ± 5 µV to ± 210 V or better - Voltage Measure: ± 1 µV to ± 210 V or better Current
- Current Source: ± 5pA to ± 100m A or better - Current Measure: ± 100fA to ± 100m A or better
2. Each DC channel must provide following forcing and measuring functions:
- Bias; Common; Sweep; List sweep (custom point-by-point user-defined sweep); Step - Source readback (i.e. when programmed to sweep voltage, report back actual measured
voltage values, instead of programmed).
3. The multi-frequency CV module at least support:
- Measuring parameters: Cp-G, Cp-D, Cs-Rs, Cs-D, R-jX, Z-theta - Frequency range: 1 kHz to 10 MHz
- AC drive level: 10 mV to 100 mV - DC drive level: -30 V to +30 V
- Programmable DC output modes: Bias, Sweep, List Sweep
- The software must include libraries for automatic CV parameter extraction for :
• Oxide Thickness
• Series Resistance
• Flatland C and V
• Threshold Voltage
• Bulk Doping
• Debye Length
• Bulk Potential
• Average Doping
• Interface Trap Density
• Effective Oxide Charge Density
4. The System must include PC operating capabilities as follows:
- Standard operating system (e.g. Windows) - User interface and data storage functionality
- Interactive point-and-click software for device characterization - High-resolution LCD screen
- Keyboard and mouse control
- Built-in large capacity hard drive, CD/DVD drive, - Built-in GPIB, Ethernet, USB and RS-232 ports
- VGA (video graphics array) port with support for external monitor.
Instrumentation Required for AC Resistivity Measurement :
The system should be the combination of High precision AC/DC current Source and a
nanovoltmeter with current reversal facility and both the instrument should have facility to provide delta mode measurements through software . The specifications of instruments should be as under : AC/DC Current source with source & sink (programmable Load) 100fA to 100mA (or better), 10
^14 Ω input impedence (or better) for stable current sourcing into variable loads , Current sweep facility should be provided, AC current from 1pA to 100mA (or better), Built in standard arbitrary waveform generator with 1mHz to 100kHz or better frequency range .Programmable pulse width as short as 5µ sec, Built in RS232 ,IEEE and Ethernet interface .
Nanovoltmeter : Voltage range : 1nV to 100V (or better), 2 –channel measurements ,Built in thermocouple realization and CJC. Current reversal facility .Built in IEEE and RS232 interface . The above system must have GPIB and RS232 interfaces .
Warranty : 36 months from the date of installation and it includes free service. Repair, and replacement of any spare parts or components.
Other requirements:
• Vendor’s should Quote separately for extended warranty .
• Vendor’s to confirm Repair & Calibration support facilities in India.
Important Notes 1. Provision for man power training-one for electronics and one for software is essential at laboratory site.
2. Test certificates of all relevant supplied equipments (viz. detector, filter etc) are essential.
3. Supply of detail operational manual (hard copy) of the whole instrument is mandatory.
4. Quote should include technical literatures of each item, detail power requirements, optimum ambient conditions (including space requirements) of the laboratory and supply of UPS, if required for uninterrupted power during operation.
5. Quote must be prepared in order as per technical specifications in the tender fulfilling the “key applications” as mentioned above.
6. The line voltage in India : 220V, 50Hz. The vendor should take care of this factor before delivery of the system.
ANNEXURE-III SPECIFICATION FOR ATOMIC FORCE MICROSCOPE(AFM)
Specifications of multifunctional Scanning Probe Microscope (AFM/STM) system should consist of both Atomic Force Microscope and Scanning Tunneling Microscope; top view optical system for cantilever and sample observation; control electronics and software;
computer control workstation and all necessary accessories and spare parts.
The offered system must include at least the following measurement modes as necessarily available in hardware and software at the time of installation:
- Contact AFM,
- Lateral Force Mode (LFM)
- Resonant Mode AFM (semicontact + noncontact AFM), - Phase Imaging,
- Force Modulation Microscopy, - Adhesion Force Imaging,
- Scanning Tunneling Microscopy, - AFM/STM spectroscopies,
- Magnetic Force Mode and Electrostatic Force Mode (MFM/EFM),
- AFM NanoLithography and Nanomanipulation (Force and Electro-oxidative) - Spreading Resistance Imaging (SRI) ,
- Scanning Capacitance Imaging (SCI) - Scanning Kelvin Probe Microscopy (SKM)
- All necessary hardware and software for these modes must be included in the offered system configuration.
The control software must have possibility to adjust system settings and parameters for these measuring modes by a single mouse click, e.g. the offered system must allow automated re- configuration for different measuring modes.
Single XYZ peizo scanner:
‐ Scanning type: XYZ by sample without any motion of the tip in XYZ Scanners must be piezo-tube construction for highest resolution. XY-stages will not be acceptable.
‐ Scanning range: 100x100x10um or higher in high voltage mode (closed-loop), 3x3x2um or lower – low voltage mode (for critical resolution)
‐ In case controller does not allow high voltage and low voltage operation of single
scanner then two separated scanners with required specifications are acceptable. Vendors are requested to provide complete details about each scanner specs, closed loop
performance and compatibility with different measuring modes.
‐ Scanner is able to do all above mentioned measuring modes without any additional hardware or software.
Scanner Closed-loop control and noise level:
‐ Non-linearity of XY: 0.15% or better
‐ Non-linearity of Z: 1% or better
‐ Noise level of XY: 0.2 nm (Closed-loop – on) or better 0.02 nm (Closed loop - off) or better
‐ Noise level of Z: 0.04 nm (Closed-loop – on) or better 0.03 nm (Closed loop - off) or better
‐ Atomic lattice resolution required Easy to use software and automation:
‐ Automated software driven control of measurement modes
‐ Automated tip-to-sample approach
‐ Automated/motorized exchange of AFM and STM heads is preferable. If manual then vendors have to provide details about measuring heads exchange procedure – include detailed manuals and description.
‐ Automated alignment of optical feedback geometry (cantilever–laser–photodiode) by means of motorized positioning of laser and photodiode.
‐ Motorized software driven sample positioning in XY; with option of matching to optical image. Range of sample positioning: 5x5 mm, positioning resolution 0,27 um or better.
‐ Motorized focus and zoom of the optical viewing system with resolution 2um or better
‐ Motorized positioning of the optical viewing system in X and Y
‐ System enclosure for isolation from external electrical and acoustic noises Vibration isolation:
Appropriate vibration isolation desktop system must be included along with the instrument. Please provide details about exact vibraiton isolaiton included: clearly specify if the offered isolation is passive or active, which type and its performance.
Spare parts and accessories:
-The offered system must include all necessary toolkits and accessories for AFM and STM including screwdrivers, tweezers, sample plates e.t.c.
-The offered system must include a set of calibration gratings for scanner calibrations in X,Y and Z in the range of few Angstroms to few Microns.
-The set of supplied cantilevers must include at least the following probes:
10 chips - for contact AFM; 25 chips - for intermittent contact AFM; 5 chips - for SSRM; 5 chips - for SKM/SCM; 5 chips - for MFM
Note: The set of standard tip as above need to be offered with the main system as well as one set of the same optionally.
Data acquisition and image processing software:
- PCs with 19’’ TFT monitor with latest configuration, should be compatible with the system Requirements.
- Automatic cantilever spring constant calibration required - Free life-time software update
- The software must include Macro Language scripting possibilities for optimization of routine operations and user-defined experiments
Image analysis software should include at least following features:
- Cross section analysis - Roughness measurement - Grain size analysis - Depth analysis
- Power spectral analysis - Histogram analysis - Fractal analysis
- Fourier analysis - Image mixing - Autocorrelation
- Enhanced image filtering tools
Image modification and presentation software should include at least following features:
- Force-distance curve analysis - 2D Fast Fourier analysis - Plane-fit
- High pass and low pass filters - Zoom in/out
- Optional grid on images and curves - Variable shading and display angle, tilt
- Color bar completely user definable 2D and 3D height presentation - Menu for image series presentation.
Image and data export format at least:
- Export to BMP, JPG, TIFF
- Export to ASCII format and MatLab
- Must include automated system configuration for operation in liquids to operate these modes by one mouse click
- Must include automated system configurations for advanced modes like SKM, MFM etc to operate these modes by one mouse click
- Software must be a sole package for all modes and attachments with no need for additional software programs.
- Software package must include both image acquisition and data processing software in one package with no need for different programs operation.
- Software must be free-for copy, eg can be installed on unlimited number of off-line PC Optional items (upgradeability):
1. Heating stage:
-Heating stage with temperature controller:
-Sample holder;
-Temperature range - up to 150C;
-Temperature stability - 0.05 C;
2. Nanoindentaiton:
-Hardware Nanoindentation (software nanoindentation using AFM cantilever just by software is not permitted)
-Nanoindentation head with optical force displacement sensor:
-Modes of operation: Surface topography, hardness and local coefficient of elasticity mapping;
-Nanoindentation and Scratching;
-Hardness measurement in the range 1-100 GPa;
-Young Modulus measurement in the range 1-1000 GPa;
-Berkovich diamond probes:
‐ stiffness 10-15*10^3 N/m
‐ stiffness 10-15*10^3 N/m 3. Liquid cell:
Easy replaceable liquid cell for conducting experiments in liquid medium.
Installation & Training
-The system must be installed, demonstrated at our facilities. At least 10 working days
comprehensive training is required. One scientist will be provided one week Application Training at factory site of the country of origin. The cost of all expenditures (including transport cost, stay, food, and some addl. Money to support his stay) will be borne by the vendor.
Warranty:
-Three years warranty on all parts and labor.
-The supplier must submit a compliance statement specifying their specs in front of each of our specs for getting clarity of the offered system.
-The supplier should have supplied minimum five AFM systems in India same or other models.
Please submit list of all users in India and the purchase/work orders of the similar system. This is mandatory.
-A complete operational manual (hard copy) to be provided.
-A set of consumables & accessories for three years of uninterrupted use must be quote separately.
- AMC after warranty period, needs to be offered separately.
Important Notes 1. Provision for man power training-one for electronics and one for software is essential
2. Test certificates of all relevant supplied equipments are essential.
3. Supply of detail operational manual (hard copy) of the whole instrument is mandatory.
4. Quote should include technical literatures of each item, detail power requirements, optimum ambient conditions (including space requirements) of the laboratory and supply of UPS, if required for uninterrupted power during operation.
5. The line voltage in India is 220V, 50Hz. The vendor should take care of this factor before delivery of the system.
6. .Quote must be prepared in order as per technical specifications in the tender fulfilling the “key applications” as mentioned above.
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ANNEXURE-IV Technical specifications for FTIR Spectrometer (FTIR)
Key Applications:
1. Study of surface stability in case of porous silicon & CNTs under corrosive pollutant gas and organic vapour.
2. Identification and differentiation of hydrophilic and hydrophobic bonds in a humid and corrosive gas environment.
3. Corrosion analysis of porous silicon and ceramic samples.
Technical Specifications:
1. The spectrometer shall be a vacuum spectrometer capable of maintaining a working pressure of less than 0.2 mbar or better.
2. The interferometer and sample chambers must be separately evacuable in order that the sample compartment may be brought up to atmospheric pressure without losing vacuum in the
interferometer and detector chambers, or, any alternative so that the internal optics should not be exposed to corrosive gases/vapour under study.
3. The minimum signal to noise for a 5 second 100% line measurement should exceed 7500:1 peak-to-peak (or < 5.8*10-5 AU noise) using the following conditions: 4 cm-1 spectral
resolution , Blackman Harris 3-Term apodization, DLaTGS detector, KBr beam-splitter (7800- 370 cm-1) and air cooled source, Noise calculated as peak-to-peak between 2200 to 2100 cm-1, Average value calculated from values for 10 consecutive measurements.
4. The instrument spectral resolution should be continuously variable to a maximum of at least 0.4 cm-1 or better and should be upgradeable to better than 0.16 cm-1 resolution.
5. The standard spectral operating range should be not less than 8000 - 350 cm-1. Future extension capability from NIR, VIS to UV should be in the system.
6. Automatic shutters to be given for sealing of the optics during sample change.
7. The systems A/D converter must have a 24 bit dynamic range or better for accurate
representation of spectra and best signal-to-noise. Gain switching schemes to achieve higher dynamic range are not acceptable, due to generation of artifacts in the data.
8. The instrument should include a software-controlled aperture wheel with 12 positions ranging from 0.25 up to 8 mm for optimization of throughput. An iris-aperture is not acceptable, due to lack of reproducibility.
9. Optical components such as detector, source and beamsplitter must be electronically coded so that these components are automatically recognized when placed in the spectrometer or removed (Automatic Component Recognition, ACR). Appropriate acquisition parameters must be
automatically set in the software.
10. The FT-IR must incorporate a high throughput 30(or 60) degree interferometer for maximum light throughput and efficiency. All optics other than the beamsplitter and non-focusing isolation windows should be reflective.
11. Sampling accessories and optics for diffused reflectance studies are required.
12. The FTIR should be fitted with IR microscope with computer controlled stage movement, optics for diffused reflectance & Transmission studies alongwith softwares including surface mapping.
The IR Microscope in future must be fully upgradeable to use a single element and a focal plane detector in parallel. The switch is performed by software. The microscope should have suitable objective(s) for long working distance to work on the samples fixed inside the sample chamber as mentioned in sl. No. 13.
13. Temperature controlled sample stage for the temperature range -196 to 6000C are required. The seller has to provide necessary items required for scanning sample surface in diffuse reflection and transmission mode during gas/vapour purging through the sample chamber
and the sample should be in the purging gas environment.
14. The interferometer must be permanently aligned and maintain the alignment during the scan or after beamsplitter exchange. “Dynamic alignment” of the interferometer is not acceptable because it may move the output beam relative to the detector enough to reduce system stability and create spectral artifacts.
15. The detectors must be easily user changeable with exactly reproducible positioning and a security lock.
16. Spectrometer components such as source, laser, detector, interferometer and automation units must be continuously monitored for operation within factory specifications (PerformanceGuard).
The operator must be immediately notified by the system software if any of the factory
specifications are not met. The software must offer detailed information about the nature of the failure and suggest possible remedies.
17. For data acquisition, a PC to be provided with intel Core 2 Quad processor, > 2.4 GHz, 2GB RAM and 250 GB HDU or better, 16X DVD+/-RW drive, 19 TFT display, color plotter, a deskjet color printer, 2 Network interfaces, Window XP professional.
18. Warranty: There will be 3 years warranty on the systemwhich includes free service, repair &
replacement of any spare parts and componets. For extended warranty the vendor has to quote AMC rate.
Important Notes 1. Provision for man power training-one for electronics and one for software is essential
2. Provision for application training for one scientist at factory site for which the vender has to bear all the expenditures (visa fee, air fair, stay, food, on road transport cost, and money for local expenditure).
2. Test certificates of all relevant supplied equipments (viz. detector, filter etc) are essential.
3. Supply of detail operational manual of the whole instrument is mandatory.
4. Quote should include technical literatures of each item, detail power requirements, optimum ambient conditions (including space requirements) of the laboratory and supply of UPS, if required for uninterrupted power during operation of the ICMRS.
5. The line voltage in India is 220V, 50 Hz. The supplier should take care of this factor before shipping/delivering the system.
6. Quote must be prepared in order as per technical specifications in the tender fulfilling the “key applications” as mentioned above. It is the full responsibility of the vendor to make the system in working condition as desired in the specifications. Any components/ parts if omitted in the specifications the vendor has to quote it with the price in the commercial bid.
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ANNEXURE-V
Procurement of MICROWAVE PLASMA ENHANCED CVD (MPECVD)/PLASMA ENHANCED CVD (PECVD) System complete with all accessories. The equipment is required for the synthesis of Single wall carbon nanotubes (SWNT) on silicon and other substrates.
System specifications Deposition Chamber:
Stainless steel SS 316/Quartz process chamber of suitable dimension complete with sample loading door and viewing port, base flange, one spare port, provision for vent, cooling water, process gas inlet, microwave/RF window/coupling etc
SS316 Pumping chamber of suitable dimensions complete with vacuum gauges, compatible SS316 tubes valves etc.
Substrate Holder & Heating Arrangement:
Substrate holder capable of holding wafers of size upto 2” (two inches diameter) including irregular shapes with the heating provision upto 1000 degree Celsius adjustable and temperature stability of 1% at 1000 C. Suitable thermocouple is to be provided to measure temperature and display the same. The substrate holder stage should have provision to move up and down by few inches. The assembly should be complete with temperature controller, position sensor, temperature sensor etc.
Pumping System:
The pumping system should comprise of suitable capacity TMP backed by chemical rotary/dry pump along with required coarse and fine vacuum measuring gauges. The pump down time should not be more than 60 minutes to achieve desired ultimate vacuum better than 5x10-5 torr or else vendor to specify.
Gas Delivery System:
Gas injection to the chamber through ¼’’ VCR fitting with a dedicated gas isolation valve. Gas delivery system should be complete with gas manifold suitable isolation valves, tubing’s /fittings etc. The system should be complete for five gases C2H2, CH4, NH3, N2, H2, with a provision for one extra line and compatible precision MFC of MKS make or equivalent of suitable flow rate complete with controller and display. Gas inlet port required to be of ¼”swagelock type.
Microwave /RF Source Assembly:
The microwave plasma generator source complete should have adjustable power upto 2.5KW (Desirable 3KW) at 2.45GHz. The unit should consist of appropriate rating isolator with isolation of 20dB or better, tuner to minimize the reflected power, directional coupler and meter to measure the forward and reflected power.
Or
The RF plasma source complete with adjustable power upto 600 watts (desirable 1 kW) at 13.56 MHz & matching network (both auto & manual with display of incident and reflected power) shielded cables, connections etc.
Suitable arrangement is to be provided for generating/ transferring plasma in growth zone.
Process Control System:
The equipment should be complete with system controller and suitable display to indicate the process flow, conditions of various interlocks, valves, electronics etc. The control unit should have master control switch. Semiautomatic/PC controlled software driven system with manual override will be preferred.
Safety:
The system should have all the safety features as per the microwave/RF safety guidelines. The vendor to mention the safety standard followed and qualified for the quoted equipment.
Important Note
The vendor is required to include all the consumables and any other part not mentioned in the specifications to make the equipment complete for the demonstration of the growth of Single wall carbon nano tubes (SWNT’s) on silicon substrate. Vendor to also include in their quotation and bring catalysts (Fe, Ni) coated Silicon wafers for demonstration of growth of the Single Wall Carbon Nanotubes for the qualification of equipment.
The equipment should be configured in such a way that it should be possible to use it either in Plasma mode or in CVD mode for the growth of SWNT.
The vendor is required to hook-up, install and demonstrate the performance of the equipment and growth of SWNT on silicon substrate. For this purpose vendor is required to include in the quote the required tubing’s/fittings/other components required including its connection to the equipment and supply point within the room where the equipment is to be installed.
The vendor will be required to train two scientists on the operation and maintenance of the equipment at their site as well as the users place.
The vendor is required to quote separately and supply the one cylinder each of capacity ~1.55 fit cube, of electronic grade process gases C2H2 (225psig), CH4 (2000psig), NH3(110psig) suitable for the growth of SWNT’s.
Vendor to also include suitable water chillier and air compressor if required for the operation of the equipment.
Vendor is required to include in the quote for supply of consumable/spares such as o-rings, substrate heater etc required for one year trouble free operation of the equipment.
Vendor to include and give one year standard warranty and mention separately the cost for three year extended warranty in the quote.
Vendor to confirm that the spare & service support will be made available for a minimum period of 7 years.
Vendor is required to clearly mention the year introduction of the quoted model by the company and also give the contact address, e-mail, phone numbers of two users of the same/similar system quoted and supplied by the firm. The feedback from the users will form important input while technically evaluating the quote.
Power Mains
The user will provide 230Volts 50 Hz single phase and or 415V, three phase AC power supply.
Vendor is required to clearly mention any other utility requirement for installation of the equipment.
Payment Terms
Vendor to note the following payment terms
70% after shipment with the confirmation from the purchaser/user 20% after installation and commissioning of the equipment
10% against bank guarantee or after one year standard warranty period
ANNEXURE-VI Procurement of Scanning Probe Microscope (SPM) with all accessories. The equipment is required for the imaging and measuring surfaces of Single wall carbon nanotubes (SWNT) on silicon and other substrates.
System Specifications
Measurement mode Contact and tapping in AFM and STM mode
Tip size Approximately ~ 1nm
Resolution X=0.1nm, Y = 0.1nm
Z = .01nm Scan range /Scanner Size (narrow
range and wide range)
(1) XY = 1µm x1µm (2) XY = 100µm x 100µm
Sample size upto15 mm, including irregular shapes upto 5 mm thickness
Software According to modes, latest software required
Standard sample For calibration of instrument:
HOPG, MICA/Standard Grid
Spectroscopy I-V/STS with STM
Image processing Latest software for Image processing
filters Appropriate for the expected performance
Sample holder Appropriate for the above mentioned sample size
SPM Scanning Controller Latest available for Windows Optical Microscope Vendor to specify
Tool Set for SPM Vendor to list and provide Colour Printer Vendor to quote and provide Vibration isolation table With compressed gas unit
Cantilever holder 2 No.s
AFM cantilever 50 No.s
STM tips 50 No.s
Tip holder 1 No.
Power supply 230V, 50 Hz AC
Important Note:
Vendor to include in the quote any other accessory/ component required for the effective operation and demonstration of the performance of the equipment.
Vendor to mention the year in which quoted system was introduced.
Vendor to write the address of two users for the same/similar system along with Telephone no. and Email Id of the users. The user feedback will be important input during technical evaluation of the equipment.
Vendor to confirm that the spare & service support will be made available for a minimum period of 7 years.
Power Mains
The user will provide 230Volts 50 Hz single phase and or 415V, three phase AC power supply.
Vendor is required to clearly mention any other utility requirement for installation of the equipment.
ANNEXURE-VII
Procurement of Gold Coating Unit for SEM System Specifications
The equipment complete in all respect is required for sputter coating of gold on to the samples for SEM imaging.
Working Chamber 160 mm (Dia.) x 120 mm (H) (Approx.)
Target (one each) Gold and Palladium with 60mm (Dia) x 0.5 mm (Thick) Specimen Stage 60 mm diameter including irregular shapes with
adjustable height spacing to target 30 to 45 mm
Vacuum Upto 10-3 Torr
Vacuum Pump Rotary Pump
Vacuum Gauge Digital Pirani Gauge
Gas Inlet Gas injection to the chamber with a dedicated gas isolation valve
Sputter Timer Digital Display (0 to 5 min.)
Power Supply 230 Volt, 50 Hz AC High voltage supply and
safety circuit
Vendor to mention the details of the required source along with power with inbuilt interlock safety
arrangements. The vendor to mention the safety standard followed and qualified for the quoted equipment.
Important Note:
Vendor to include in the quote any other accessory/ component required for the effective operation and demonstration of the performance of the equipment.
Vendor to mention the year in which quoted system was introduced.
Vendor to write the address of two users for the same/similar system along with Telephone no. and Email Id of the users. Feed back of the users will an important technical input.
Vendor to confirm that the spare & service support will be made available for a minimum period of 7 years.
Power Mains
The user will provide 230Volts 50 Hz single phase and or 415V, three phase power supply. Vendor is required to clearly mention any other utility requirement for installation of the equipment.
(Signature of Tenderer with Seal)
